Suspension from office (Article 114 of the Code of Criminal Procedure) is a preventive and security measure of procedural coercion, the content of which consists in temporarily preventing the suspect or accused from fulfilling their obligations. job duties in order to prevent his attempts to obstruct the proceedings or the execution of the sentence.

An analysis of the procedural law allows us to identify three special conditions for temporary removal from office:

a) the person has the procedural status of a suspect or accused;

b) the suspect or accused has the status of an official. Formally, the concept of an official is given in the note to Art. 285 of the Criminal Code of the Russian Federation. However, this concept refers to the subjects of malfeasance and does not fully disclose the term "official" used in the procedural law (Article 114 of the Code of Criminal Procedure). The removal of the accused from office pursues not only the goal of preventing his attempts to obstruct the elucidation of the truth, but also to ensure the execution of the sentence (part 1 of article 111 of the Code of Criminal Procedure). This measure may ensure the execution of a future punishment in the form of deprivation of the right to hold certain positions or engage in certain activities (Article 47 of the Criminal Code of the Russian Federation). Therefore, the accused must be removed not only from public office, but also from work in his specialty, if the crime imputed to him is related to this work (especially if the sanction of the relevant article of the Special Part of the Criminal Code of the Russian Federation provides for punishment in the form of deprivation of the right to engage in certain activities) . For example, an accountant accused of falsifying financial documents may be suspended; a driver accused of a criminal violation of traffic rules;

c) measures of restraint in the form of detention have not been applied to the accused, or house arrest. Keeping the accused in strict isolation usually precludes him from performing his job duties.

The basis for the temporary removal of a suspect or accused person from office is educated guess that in the performance of his official duties, he may commit a new socially dangerous act, prevent the clarification of the truth in the case, as well as the need to execute a possible punishment in the form of deprivation of the right to engage in a certain kind activities. This assumption must follow from specific facts established by proof.

In the pre-trial stages for the temporary removal of a suspect or accused from office (except for higher officials countries), the investigator, with the consent of the head of the investigative body, and the interrogating officer, with the consent of the prosecutor, issues a reasoned decision to initiate a relevant petition before the court. This measure of coercion limits the constitutional right to dispose of the ability to work and to choose professional activity(part 1 article 37

Constitution of the Russian Federation), therefore, it is applied only by a court decision (clause 10, part 2, article 29 of the Code of Criminal Procedure). The petition is considered by a district (or military of the same level) judge (part 9 of article 31) at the place of preliminary investigation. Within 48 hours, the judge issues a decision on suspension from office or on refusal to do so. The decision to remove from office is sent to the administration at the place of work of the suspect or the accused, which is obliged to execute it.

The procedural law does not expressly provide for suspension from office in the judicial stages. However, such a possibility exists based on the meaning of this coercive measure and the content of Part 2 of Art. 29. The court in the case, which is in its proceedings, should have the right to those specified in Art. 114 grounds to remove the accused from office both on the initiative of the prosecution and on his own initiative (in the absence of objections from the prosecutor).

The ruling on temporary dismissal from office indicates the decision of the judge to award the accused a state allowance in the amount of 5 minimum wages.

Temporary removal from office is canceled by the decision of the investigator, interrogating officer, prosecutor, judge or by court order, when the grounds for its application no longer exist. In any case, the removal from office is canceled upon resignation:

a) general conditions for the application of measures of procedural coercion: upon termination of a criminal case (Articles 213, 239); the decision of an acquittal or a sentence not related to the imposition of punishment (Articles 306, 311); appeal of a guilty verdict for execution (part 4 of article 390, article 393); suspension of a criminal case;

b) special conditions for the application of this coercive measure: termination of criminal prosecution against this suspect or accused, termination of his employment relationship (Article 77 of the Labor Code of the Russian Federation); placing the accused in custody or under house arrest.

For the removal from office of the head of the supreme executive body state power subject Russian Federation(the governor of the region, the chairman of the government of the republic) there is a special procedure (part 5 of article 114 of the Code of Criminal Procedure). If such a high-ranking leader is accused of committing an intentional crime, for which a punishment of more than 5 years in prison is provided, Attorney General The Russian Federation sends a reasoned proposal to the President of the Russian Federation on the temporary removal of the said person from office. The President, within 48 hours from the moment of receipt of the submission, makes a decision on removal from office or on refusal to do so.

For a number of categories of officials with official immunity, a special procedure has been established for initiating a criminal case and bringing them as defendants (Articles 447-448 of the Code of Criminal Procedure). Subject to this procedure, their temporary removal from office is carried out on a general basis.

The decision of the court on removal from office can be appealed in the appeal, cassation procedure both by the accused himself and by the administration at his place of work1.

In addition to a special measure of coercion in the form of temporary removal from office, a different procedure is sometimes used in practice. If it is established in the case that the labor activity of the accused (the suspect or his leader) served as a condition for the commission of the crime, then the investigator has the right to send a submission to the appropriate administration (part 2 of article 158 of the Code of Criminal Procedure), and the court - a private ruling (part 4 of article 29 Code of Criminal Procedure) to eliminate this condition. At the same time, the administration, considering the submission and a private determination, has the right (but is not obliged) to suspend or dismiss the accused in accordance with labor legislation.

More on Topic 3. Suspension:

1. § 6. Suspension from driving. Medical examination for intoxication. Detention of the vehicle. Prohibition to operate the vehicle. Temporary ban
2. CHAPTER IV, OFFICES OF THE INTERN AND ASSISTANT TO THE NOTARY. PROCEDURE FOR FILLING THE POSITION OF A NOTARY IN PRIVATE PRACTICE
3. Suspension from driving and medical examination for intoxication
4. § 2. Civil service positions. Registers of civil service positions
5. What is the difference between temporary registration and temporary registration?

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In the laboratory for research optical properties transparent films, a "Specord UV-VIS" spectrophotometer is used, designed to work in the ultraviolet and visible regions of the spectrum, and an LMF-72M photometer. Let us consider specific problems that can be solved using photometric instruments.

1. Determination of the refractive index of a transparent substrate

The refractive index is one of the main optical characteristics. It determines the speed of propagation of a light wave in a substance. Knowing it is necessary for materials used in optics.

When radiation with intensity I 0 is incident on a transparent substrate, one part of the beam is reflected (IR), the other part passes through it (IT) (Fig. 17). Without taking into account the absorption of radiation inside the substrate, we note that the fraction of transmitted and reflected radiation depends on the refractive index:

Rice. 17. Schematic course of rays when light falls on a transparent substrate

The transmittance (T) and reflectance of the substrate (R) at wavelength l can be calculated as follows:

where

n p - refractive index of the substrate at wavelength l.

Thus, by measuring the transmittance at the desired wavelength, one can obtain the refractive index of the substrate from this expression. The incidence of light on the substrate should be close to normal.

2. Determining the thickness of a transparent film on a transparent substrate

For transparent thin dielectric and semiconductor films, when light falls on them, interference phenomena are characteristic (Fig. 18).

Fig.18. Schematic path of rays through the transparent film-substrate system

Under certain conditions, when adding reflected or transmitted beams, interference will be observed with an increase or decrease in intensity, and the transmission (reflection) spectrum will look like this (Fig. 19).

Fig.19. Transmission spectrum of the film-substrate system

Without considering the mathematical derivation of the formulas, we note that in the transmission spectrum of the film-substrate system at normal incidence of radiation, extreme values ​​are observed under the condition n pl d=m l/4,

where n pl is the refractive index of the film;

d is the film thickness;

m is the order of interference;

l is the wavelength at the extreme.

Maximum values transmission coefficients correspond to even m, the minimum - to odd ones. For two adjacent extrema with even m, we can write:

n pl d = m l m /4=(m+2) l m+2 /4,

l m and l m+2 - wavelengths corresponding to neighboring extrema with even m.

From here

If the refractive index of the film is unknown, then it is found from the expression:

where T is the transmission coefficient of the film-substrate system for odd m; n pl - refractive index of the film;

n p - refractive index of the substrate;

Having determined m, n p, n pl, determine the film thickness d.

3. Measuring the transmittance of metallic films

Unlike dielectrics and semiconductors in metals big number electrons are weakly bound to metal atoms, and these electrons are considered free. The presence free electrons the features of the reflection of light from a metal surface are explained. Secondary waves caused forced vibrations free electrons, generate a strong reflected wave, the intensity of which can reach 95% (and even more) of the incident intensity, and a relatively weak wave that goes inside the metal. Since the density of free electrons is very significant (~ 10 22 in 1 cm 3), even very thin metal layers reflect most light falling on them. That part of the light energy that penetrates into the metal experiences absorption in it.

What proportion of light is not transmitted by the metal due to reflection and what is retained in it due to absorption depends on its conductivity. In an ideal conductor, the absorption is zero, so the incident light is completely reflected. Silver films approach this ideal. In metals that are worse conductive, for example, in iron, reflection can be only 30-40%, so that an opaque iron film no more than a fraction of a micron thick absorbs about 60% of the light incident on it.

Thus, salient feature metal, consisting in its high reflectivity and manifested in the presence of a special "metallic" luster of a clean surface, is associated with its electrical conductivity. The higher the electrical conductivity, the more general case, higher reflectivity of metals.

In our laboratory, the reflectivity of metals can be measured with a He-Ne laser at 630 nm. Literature data for a close wavelength give the following relationship between the reflection coefficient of a metal film at a wavelength of 600 nm and resistivity:

But high values reflection coefficient can only be obtained for films obtained under optimal conditions. The factors affecting the reflection coefficient are: the deposition rate, the pressure during deposition, the thickness of the deposited film, the temperature of the substrate, the angle of incidence of the substance, the degree of purity of the evaporated material, and, finally, the aging of the resulting coating in air.

The absorption of light by metals can be used to estimate the thickness of the metal film. The passage of light through conductive substances is determined by the relation:

I=I 0 exp(-4πnkd/l),

where d is the thickness of the absorbing layer;

n is the refractive index for wavelength l;

k is the absorption index for wavelength l;

I 0 - intensity of the incident radiation;

I is the intensity of the transmitted radiation.

Measuring the transmittance of a translucent metal film (I/I 0) will allow us to estimate its thickness using the above formula.

Table 2.1

Determination of the transmittance on the LMF-72M photometer

Photometer type LMF-72 is designed to measure the transmittance and optical density in the spectral range from 365 to 750 nm and determine the concentration of solutions according to calibration graphs, as well as an indicator for nephelometric and fluorimetric analysis. The optical scheme of the photometer is shown in Fig. 20.

Fig.20. Optical layout of the LMF-72M photometer

1-incandescent lamp;

2-condenser;

3-lens;

4-slit diaphragm;

5-modulator;

6-change interference or absorption filter;

7-thermal light filter;

8-measured sample;

9-absorption light filter; "

10-protective glass;

11-photomultiplier.

The laboratory photometer is made according to a single-beam scheme with light flux modulation and direct reading. When measuring the transmittance, the light flux from an incandescent lamp (1), formed by a condenser consisting of lenses (2) and an objective (3) into a parallel beam, through a continuously adjustable diaphragm slit (4), a light flux modulator (5), an interference light filter (6) passes through the measured sample and hits the photocathode of the light detector.

Operating procedure

1. Connect the photometer to the network. The warm-up time of the device is 10-15 minutes.

2. Calibrate the T scale. To do this, insert an interference light filter with the required wavelength at maximum transmission into the "filter" slot, the cell holder in the "0" position. Press the "Y" button and, turning the "0-precisely" knob, align the pointer of the indicating instrument with the "0" mark on the scale. Set the cuvette holder to the "100" position, use the "diaphragm" knob to move the instrument pointer to the "100" mark on the scale, then use the "100-accurate" knob to align the pointer with the "100" mark.

3. Transmittance measurement. Set the cuvette holder to position "0". Remove the cover and insert the sample to be measured into the holder. Close the lid, move the cuvette holder to the "100" position and read off on the scale of the measuring device (transmittance in percent).

4. Turn off the photometer.

When working on a photometer, it is prohibited:

Change filters in position "100".

Perform measurements with the measuring chamber open.

Investigation of transmission and absorption spectra in the ultraviolet and visible regions of the spectrum on the instrument "Specord UV-VIS"

"Specord UV-VIS" is an automatic two-beam spectrophotometer that records linearly the transmission or extinction of samples as a function of the wavenumber. The representation of the spectra in terms of the wavenumber is convenient, since by the relation E = hν = hc/l = hc , where

E-energy;

h is Planck's constant;

c is the speed of light;

v - frequency;

l - wavelength;

wave number,

the energy is directly proportional to the wave number.

The principal optical diagram of the "Specord UV-VIS" spectrophotometer is shown in Fig.21.

A deuterium lamp is used as a light source in the ultraviolet region of the spectrum, and an incandescent lamp is used in the visible region. The light beam enters the entrance slit of the monochromator, from where the monochromatic beam is directed to a mirror chopper, where it is divided into two streams, forming a measurement channel and a comparison channel. Light is incident on the radiation receiver, which is an antimony-cesium photomultiplier, either from the sample channel or from the comparison channel. The spectra are recorded with a pen on a special form.

The design of the spectrophotometer provides for various registration parameters. AT this moment installed on the device: the scale of the wave number-12.5mm/1000 cm -1; spectrum registration time - 4.4 min/sheet; registration speed-5000 cm -1 / min.

Fig.21. Optical scheme of the spectrophotometer "Specord UV-VIS"

The wave number is counted according to the vernier. When working, the following scales of ordinates are used:

0 - 100% transmittance, standard area;

0 - 20% transmission coefficient, stretching of ordinates for samples with low permeability;

0.1 - +1.4-extinction.

The order of work on the spectrophotometer "Specord UV VIS"

1. Plug the device into the mains. Press the "Network" button.

2. Turn on the lamp (light source) for the corresponding part of the spectrum.

3. Insert the pen of the recorder.

4. Using the "Fast forward" and "Fast back" buttons, set an integer number by vernier against zero (for example, 21000 cm -1). Put the registration sheet on the recorder carriage so that with the measurement channel closed, the recorder pen is at the point of intersection of the horizontal zero line and the vertical line.

5. Check the zero position and the correct installation of the registration sheet by conducting a trial registration (press the "Start" button).

6. Set 100% line. Open the measurement channel and conduct a trial registration. If the registered line runs parallel to 100%, then it is displayed at 100% with the 100% correction knob.

7. Press the "Fast back" button. The carriage moves quickly to the right, and the recording device takes the leftmost position.

8. Place the sample to be measured in the cuvette compartment in the near channel.

9. Press the "Start" key. Registration started in this way can be interrupted at any point by pressing the "Stop" key.

10. Take out the registration sheet, turn off the lamp, press the "Network" button.

Button control on the front panel

Fast forward. The carriage moves quickly to the left, while the wave number is being driven.

Quickly back. The carriage moves quickly to the right.

Registration with automatic carriage return.

Start. Beginning of spectrum recording.

Stop. The recorder stops.

Radiation source.

Optical properties of thin films (n,k values)

The refractive index is one of the main optical characteristics. It determines the speed of propagation of a light wave in a substance. Knowing it is necessary for materials used in optics.

Unlike dielectrics and semiconductors in metals, a large number of electrons are weakly bound to metal atoms, and these electrons are considered free. The presence of free electrons explains the features of light reflection from a metal surface. Secondary waves caused by forced oscillations of free electrons generate a strong reflected wave, the intensity of which can reach 95% (and even more) of the incident intensity, and a relatively weak wave that goes inside the metal. Since the density of free electrons is very significant (~ 10 22 in 1 cm 3), even very thin layers of metal reflect most of the light incident on them. That part of the light energy that penetrates into the metal experiences absorption in it.

What proportion of light is not transmitted by the metal due to reflection and what is retained in it due to absorption depends on its conductivity. In an ideal conductor, the absorption is zero, so the incident light is completely reflected. Silver films approach this ideal. In metals that are worse conductive, for example, in iron, reflection can be only 30-40%, so that an opaque iron film no more than a fraction of a micron thick absorbs about 60% of the light incident on it.

Thus, the characteristic feature of a metal, consisting in its high reflectivity and manifesting itself in the presence of a special "metallic" luster of a clean surface, is associated with its electrical conductivity. The higher the electrical conductivity, the higher the reflectivity of metals in general.

The experimentally obtained table of the reflectivity of metals was measured using a helium-neon laser at a wavelength of 600 nm:

However, high values ​​of the reflection coefficient can be obtained only for films obtained under optimal conditions. Factors affecting the reflection coefficient are: deposition rate, pressure during deposition, thickness of the deposited film, substrate temperature, angle of incidence of the substance, degree of purity of the evaporated material, and, finally, aging of the resulting coating in air.

2.1.

A thin film on the surface of the lens gives a minimum in reflected light for green. To achieve a minimum for purple, can …

A. Increase the film thickness while keeping the refractive index unchanged.

B. Reduce the film thickness while keeping the refractive index unchanged.

C. Increase the refractive index of the film at the same film thickness.

D. Reduce the refractive index of the film at the same film thickness

B or D

A thin film is deposited on a glass lens, which gives a minimum in reflected light (optics enlightenment). What parameters affect the effect of enlightenment?

A. Film thickness.

B. Film refractive index.

C. The wavelength of the incident light.

Only A and B

If a thin soap film is illuminated with light with a wavelength of 0.6 μm, then the path difference of the two reflected waves for the light and the dark interference fringes following it differ by ... (in nm)

300 ;

If the phase difference of two interfering light waves is equal to 5p, and the path difference between them is equal to m, then these waves have a length

(in nm) equal to

4) 500

The formula for the relationship between the path difference and the phase difference is:

2)

A thin glass plate with a refractive index and thickness is placed between two media with refractive indices and , and . Light with a wavelength is normally incident on the plate. The optical path difference of the interfering reflected rays is equal to...

A thin glass plate with a refractive index and thickness is placed between two media with refractive indices and , and . Light with a wavelength is normally incident on the plate. The optical path difference of the interfering reflected rays is equal to...

A thin glass plate with a refractive index and thickness is placed between two media with refractive indices and , and . Light with a wavelength is normally incident on the plate. The optical path difference of the interfering reflected rays is equal to...

The appearance of colored oil streaks in puddles is associated with ...

1) interference 2) dispersion 3) aberration 4) oil coloration

Diffraction of light

Half of the diffraction grating is covered at one end with an opaque barrier, as a result of which the number of strokes decreases. What will change with this?

A. Distance between major peaks.

B. Lattice constant.

C. Brightness maxima.

2) only C

Greatest Order spectrum for a wavelength of 400 nm, if the period of the diffraction grating is 2 μm, equals

5

3.3.

The same diffraction grating is illuminated by different monochromatic radiations. Which pattern corresponds to the light illumination greatest length waves? (Here J

There are 4 gratings with different periods, illuminated by the same monochromatic radiation. Which figure illustrates the position of the main maxima created by a diffraction grating with the smallest period d? (Here J is the light intensity, j is the diffraction angle).

The period of the diffraction grating is d = 5 μm. The number of observed main maxima in the spectrum of the diffraction grating for = 760 nm is:

13 or 6(?)

3.6.

An opaque screen is installed between the point source and the observation point, in which a hole is made with a radius equal to the radius the first Fresnel zone. How will the light intensity in the center of the screen change?

1) will increase 4 times

An opaque screen is installed between the point source and the observation point, in which a hole is made with a radius equal to the radius of half of the first Fresnel zone. How will the light intensity in the center of the screen change?

3) will increase by 2 times

An opaque screen is installed between the point source and the observation point, in which a hole is made with a radius equal to the radius of the first two Fresnel zones. How will the light intensity in the center of the screen change?

Decreases to almost zero

Action zone plate Fresnel is equivalent to...

1) converging lens

The laser emits light with a wavelength of 600 nm. The laser light is divided into two beams, which are then directed to the screen. Determine the optical path difference of the beams, at which the maximum illumination is observed on the screen. 1.2 µm

Light polarization

Light in which the directions of vibration are ordered in some way is called

1) polarized

When light is incident at the Brewster angle, the reflected light has following properties:

3) plane-polarized, the vector of which oscillates perpendicular to the plane of incidence

Intensity I of polarized light passing through an ideal polarizer (α is the angle between the plane of oscillation of the incident light and the plane of polarization):

5)

For natural light, the degree of polarization is:

2) 0

The degree of polarization P of partially polarized light is 0.5.

How many times the maximum light intensity differs,

passed through the analyzer, from the minimum?

Answer: 3

natural light falls on the glass surface at the Brewster angle.

What is the degree of polarization of the reflected rays?

1

The totality of phenomena wave optics, in which the transverseness of light waves is manifested, is called the phenomenon ...

polarization

The maximum condition for diffraction by a narrow slit is given by:

1)

Which of the following expressions determines the positions of the intensity minima in the diffraction pattern from a narrow slit.

2)

The maximum condition for diffraction by grating is defined by the expression:

B)

G)